二手儀器-中古儀器-儀器維修-儀器租賃-儀器買賣-收購服務-弘燁科技

The E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R+D of components and circuit designers who evaluate components in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution. 

The E4991A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz). 

The E4991A-010, Probe Station Connection Kit, enables us to easily connect the Agilent E4991A to a RF probe system from Cascade Microtech for making on-wafer impedance measurements. 

The temperature characteristic test kit, the E4991A-007, is a new solution of temperature characteristic measurement for components and materials. This option provides highly accurate temperature characteristic analysis capability within the wide temperature range from - 55C to + 150C with a powerful temperature drift compensation function.

• 主要規格與效能（Core Specifications）

  產品定位（Product Overview）

  ・由 Agilent Technologies 設計之高階 RF Impedance / Material Analyzer
  ・支援高頻被動元件與電子材料精密阻抗與介電分析
  ・採用 RF-IV Measurement Technique（非反射式量測架構）
  ・提供寬阻抗範圍下更高準確度與穩定性

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  頻率範圍與解析度（Frequency Range & Resolution）

  ・Internal Synthesizer Sweep：1 MHz to 3 GHz
  ・Frequency Resolution：1 mHz
  ・支援超寬頻高解析阻抗掃描分析

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  量測精度（Measurement Accuracy）

  ・Basic Impedance Accuracy：±0.8%
  ・High Q Accuracy（低損耗元件高精度分析）
  ・適用高品質因數材料與元件特性研究

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  量測技術架構（Measurement Technology）

  ・RF-IV Technique（電壓電流量測法）
  ・較反射式量測具更寬阻抗範圍與更高準確度
  ・特別適合微小元件與低損耗材料分析

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  材料量測能力（Material Measurement Capability）

  ・Dielectric & Magnetic Material Measurement Solutions
  ・Frequency Range：1 MHz to 1 GHz
  ・支援介電與磁性材料參數直接分析
  ・適用先進封裝與高頻低損耗材料研發

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  晶圓與微元件量測（On-Wafer Measurement – Option 010）

  ・Probe Station Connection Kit（E4991A-010）
  ・支援 RF Probe System（如 Cascade Microtech）
  ・進行 On-Wafer 與微結構元件阻抗量測
  ・Frequency up to 3 GHz

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  溫度特性量測（Temperature Characteristic Test – Option 007）

  ・Temperature Range：-55°C to +150°C
  ・高精度溫漂補償分析功能
  ・適用元件與材料溫度穩定性研究

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  內建分析功能（Built-in Analysis Functions）

  ・Equivalent Circuit Analysis（等效電路模型分析）
  ・Wide Impedance Range Characterization
  ・適用研發與可靠度測試流程

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  系統整合與特性（System Integration & Features）

  ・支援多種治具與材料測試套件整合
  ・可進行高頻、偏壓、溫度同步量測分析
  ・適用研發、QA、產線 EOL／ATE 測試環境
  ・特別適合 RF 與高速電子設計驗證

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  典型應用（Typical Applications）

  ・AI 伺服器／HPC 高速電源網路 PDN 阻抗分析
  ・SI／PI（訊號完整性／電源完整性）驗證
  ・5G / 6G 射頻模組與高頻被動元件特性量測
  ・WiFi 6 / WiFi 7 高速射頻電路與材料測試
  ・LTE／NB-IoT 通訊元件阻抗分析
  ・半導體封裝基板與低損耗材料研發
  ・介電與磁性材料特性研究
  ・晶圓級元件與微結構測試

  
  E4991A - 001 - ADD DC BIAS
• E4991A - 002 - ADD MATERIAL MEASUREMENT FIRMWARE 
• E4991A - 007 - TEMPERATURE CHARACTERISTIC TEST KIT 
• E4991A - 010 - PROBE STATION CONNECTION KIT 
• E4991A - 16092A - SPRING CLIP FIXTURE 
• E4991A - 16190B - PERFORMANCE TEST KIT 
• E4991A - 16192A - PARALLEL ELECTRODE SMD TEST FIXTURE 
• E4991A - 16194A - HIGH TEMPERATURE COMPONENT TEST FIXTURE 
• E4991A - 16196A - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ 
• E4991A - 16196B - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ 
• E4991A - 16196C - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ 
• E4991A - 16196D - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ 
• E4991A - 16197A - BOTTOM ELECTRODE SMD TEST FIXTURE 
• E4991A - 16200B - EXTERNAL DC BIAS ADAPTER 
• E4991A - 16453A - DIELECTRIC MATERIAL TEST FIXTURE 
• E4991A - 16454A - MAGNETIC MATERIAL TEST FIXTURE 
• E4991A - 1A7 - ISO 17025 COMPLIANT CALIBRATION
• E4991A - 1CM - RACKMOUNT KIT
• E4991A - 1CN - HANDLE KIT
• E4991A - 1CP - RACKMOUNT AND HANDLE KIT
• E4991A - 1D5 - HIGH STABILITY FREQUENCY REFERENCE 
• E4991A - 800 - STANDARD FREQUENCY REFERENCE