二手儀器-中古儀器-儀器維修-儀器租賃-儀器買賣-收購服務-弘燁科技

• Flagship Semiconductor Device Analyzer / Parameter Analyzer for advanced device characterization
• Modular mainframe architecture supports flexible configuration with SMU / CMU / PGU / WGFMU modules
• Supports DC I-V / Pulsed I-V / C-V (including QSCV) measurements for full characterization
• Designed for ultra-low leakage measurements (fA level, depending on SMU module configuration)
• Enables on-wafer device characterization & reliability tests with stress / breakdown / endurance evaluation
• Integrated automation capability for R&D, process verification, QA, and ATE applications
• Provides graphical data display / analysis and supports programmatic control for test automation

• Keysight B1500A semiconductor device analyzer

• Agilent B1500A parameter analyzer

• Semiconductor Device Analyzer / Parameter Analyzer

• SMU CMU PGU WGFMU modular mainframe

• DC IV measurement / CV measurement / QSCV

• Pulsed IV measurement

• Ultra low leakage fA SMU measurement

• On wafer device characterization system

• Reliability / stress test / breakdown test

• MOSFET Id-Vg / Id-Vd / Vth

• TFT transfer curve / output curve

• SiC GaN power device test

• Wafer prober parameter analyzer

• Switching matrix / MUX for wafer test

Keysight (Agilent) B1500A Semiconductor Device Analyzer（半導體元件分析儀 / 參數分析儀） 為旗艦級 Device Characterization System，採用模組化平台，可依需求配置 SMU / CMU / PGU / WGFMU 等量測模組，支援 DC I-V、Pulsed I-V、C-V / QSCV、可靠度 Stress 等完整元件特性分析，適用於 MOSFET / FinFET / TFT / Diode / BJT / Power Device（SiC / GaN） 等測試場景。

模組化架構（Modular Measurement Platform）

• 主機採 Mainframe 模組化設計，可依需求擴充量測通道與功能
  Modular mainframe design for flexible channel and function expansion

• 支援多種量測模組（依配置）：

  • SMU（Source/Measure Unit）

  • CMU（Capacitance Measurement Unit）

  • PGU（Pulse Generator Unit）

  • WGFMU（Waveform Generator/Fast Measurement Unit）

• 可搭配 Switch Matrix / MUX 建置多 DUT 自動測試架構
  Supports switching matrix / multiplexer for automated multi-DUT characterization

I-V 特性量測（DC I-V Characterization）

• 支援多通道 DC I-V 量測：Sweep / Step / Point measurement
  Supports multi-channel DC I-V sweep and point measurements

• 常用量測：Id-Vg / Id-Vd / Vth / Leakage / Breakdown
  Key measurements: Id-Vg, Id-Vd, threshold voltage, leakage, breakdown

• 適用元件：MOSFET、TFT、Diode、BJT、Power Device 等
  Suitable for MOSFET/TFT/Diode/BJT/Power device characterization

超低漏電量測（Ultra-Low Leakage Measurement）

• 依 SMU 模組配置可支援 fA 等級超低漏電量測
  fA-level ultra-low leakage measurement capability (depends on SMU modules)

• 支援 Triax / Guard 架構降低漏電與雜訊，提升高阻抗測試穩定度
  Triax/guarding improves accuracy for high-impedance measurements

C-V / QSCV 量測（Capacitance-Voltage Measurement）

• 依 CMU 模組配置支援 C-V / QSCV（Quasi-Static C-V）
  C-V and QSCV capability with CMU modules

• 適用於：氧化層、介電層、MOS 結構、材料與製程參數分析
  Suitable for dielectric/oxide/MOS structure characterization

Pulsed I-V 脈衝量測（Pulse Measurement）

• 支援 Pulsed I-V / Pulsed bias 測試（依 PGU / WGFMU 配置）
  Supports pulsed I-V and pulsed bias measurements (PGU/WGFMU modules)

• 可降低 self-heating 影響，適用功率元件（SiC / GaN）與高電流元件量測
  Minimizes self-heating effects; ideal for SiC/GaN power device characterization

可靠度與應力測試（Reliability / Stress Test）

• 支援 Stress / Endurance / Breakdown / Aging 等可靠度測試流程（依模組/設定）
  Supports reliability tests such as stress, endurance, breakdown, aging

• 可搭配晶圓探針台進行 On-wafer Reliability 測試與製程監控
  Enables on-wafer reliability evaluation with wafer prober

On-wafer 晶圓級量測（Wafer Probing）

• 可整合 Wafer Prober、Probe Card、Triax Cable、Switch Matrix
  Integrates with wafer prober, probe card, triax cabling, and switching matrix

• 適合研究、製程開發與量產前期驗證（R&D / Process / QA）
  Ideal for R&D, process development, and QA verification

自動化與程式控制（Automation & Control）

• 支援圖形化量測、曲線繪製與參數萃取
  Provides graphical measurement and data analysis capability

• 可整合自動化量測系統，適用於 ATE/批次測試
  Enables automated test flows for ATE and batch characterization

• 支援程式化控制（常見於半導體實驗室自動測試平台）
  Supports programmatic control for semiconductor characterization setups