規格
多通道高速架構（Multi-Channel High-Speed Architecture）
Supports four synchronized high-speed test lanes with NRZ and PAM4 signaling for ultra-high-speed multi-lane communication systems. 任意速率與高速通訊標準支援（Flexible Data Rate Configuration） 支援多種標準高速速率（GBaud）：
20.2752 / 20.6250 / 21 / 24 / 24.33 / 25 / 25.3440 / 25.78125 / 26 / 26.5625 27.9524 / 28.0500 / 28.2 / 28.9
支援高速 PAM4 / NRZ 通訊測試架構
適用於新世代高速光模組與交換器互連系統
Supports flexible data rates for next-generation high-speed optical and electrical communication standards. 誤碼分析與 FEC 監測功能（BER Measurement & FEC Analysis）
即時 Bit Error Rate（BER）量測
適用於高速系統穩定性與可靠度驗證
Provides continuous BER monitoring and FEC analysis for high-speed transmission reliability validation.
Supports industry-standard PRBS patterns and stress test sequences for PAM4/NRZ systems.
高速訊號品質特性（Signal Integrity Performance）
| 上升時間（20–80%） | ＜20 ps |
|---|---|
| 下降時間（20–80%） | ＜20 ps |
| 隨機抖動（RJ RMS） | ＜800 fs |
| 差分輸出振幅 | 400 mV – 1000 mVpp（常用 600 / 800 mV） |
高精度時脈架構確保高速訊號穩定性
硬體介面與控制方式（Hardware Interface & Control）
差分 PAM4 / NRZ 高速輸出介面
PC 軟體設定與即時誤碼分析操作
工作電壓（DC）：6 – 12 V
原廠英文說明
The GE0256A high-speed bit error rate tester (BERT) from GECHIPS-TECH delivers ultra-high performance multi-channel signal generation and advanced error analysis for next-generation electrical and optical communication systems. Featuring four synchronized test channels supporting NRZ and PAM4 signaling with data rates up to 50 Gb/s per lane, the GE0256A enables aggregate throughput up to 200 Gb/s while maintaining ultra-low jitter and high signal integrity. Designed for high-speed optical transceiver validation, PAM4 SerDes link characterization, FEC analysis, and data center interconnect compliance, the GE0256A supports a wide range of PRBS patterns and stress test modes for reliable verification across 100G, 200G, and 400G applications. Its flexible data rate configuration, precision clocking architecture, and USB-based control interface provide efficient integration into advanced R&D environments and high-volume production test workflows.