產品介紹
產品定位與應用Keysight N1000A DCA-X 取樣示波器
Sampling Oscilloscope
Eye Diagram / Jitter / Mask Test
Optical & Electrical 屬於向量網路分析與射頻微波元件量測設備，適合用於S 參數、回波損耗、增益／損耗、濾波器、放大器、天線、線纜與 RF 模組驗證等情境。
實際量測範圍與選配需依機身配置、附件與校正狀態確認。
選型時建議同步確認頻率範圍、埠數、動態範圍、校正件、測試治具、Bias Tee 與其他選配功能，避免後續因選配、治具或校正條件不符而影響測試進度。
弘燁科技可依目前庫存、附件組合、校正需求與交期，協助比對同級替代型號並整理詢價所需資訊。
規格
Keysight N1000A DCA-X 為高速 Sampling Oscilloscope / Eye Diagram Analyzer（取樣示波器/眼圖分析平台），採 模組化架構（Plug-in modules），可依需求配置高速電性與光學量測模組，提供 Eye Diagram、Jitter Analysis、Mask Test 等核心測試功能，適用於 SerDes 高速鏈路、PAM4/NRZ 光電通訊與AI 伺服器/資料中心高速周邊互連驗證場景。
模組化架構（Modular DCA-X Platform）
DCA-X 主機 + Plug-in 模組架構
Modular mainframe with plug-in measurement modules
可依需求搭配 Electrical / Optical 量測模組
Supports electrical & optical measurement modules (option dependent) 可建構完整高速驗證平台，適合 R&D / QA / 產線測試 Suitable for R&D validation, QA verification and manufacturing test
眼圖量測（Eye Diagram Measurements）
支援 Electrical Eye / Optical Eye（依模組配置）
Electrical & optical eye diagram measurements
適用於高速鏈路品質判定與 margin 量測
Eye margin measurement for high-speed links
Jitter & timing characterization for high-speed signals
Ideal for clocking quality & jitter troubleshooting
支援 Mask Test（Pass/Fail） 遮罩判定（依軟體/選配）
Mask testing for compliance and production screening (option dependent)
Suitable for R&D, QA and EOL pass/fail testing
AI 相關適用應用（AI/Data Center Applications）
N1000A DCA-X 常用於 AI 伺服器與資料中心高速互連測試，包含： AI Server 高速 SerDes link debug/validation（高速背板、連接器、線材、retimer/redriver）
Data Center 光通訊模組測試：SFP/QSFP/OSFP Transceiver（Electrical/Optical Eye） **400G / 800G Ethernet（PAM4）**相關的 jitter / mask / margin 檢測（依模組/軟體）
支援自動化測試整合（R&D / QA / Manufacturing）
Automation-ready for lab and production environments
適用大量測點與快速 pass/fail 篩檢流程
Suitable for production screening & regression test workflows
原廠英文說明
Modular DCA-X sampling oscilloscope platform for high-speed electrical / optical waveform analysis Supports Electrical & Optical Eye Diagram measurements (NRZ / PAM4, depends on plug-in modules) Comprehensive Jitter Analysis and Mask Test for compliance and validation
Plug-in architecture supports multiple DCA-X measurement modules (electrical sampling modules and optical modules) Ideal for high-speed serial links / SerDes validation and debugging Enables testing for data center interconnects and transceiver modules (QSFP / OSFP / SFP)
Supports clock / timing / jitter characterization and waveform analysis High repeatability sampling measurement for signal integrity validation Automation-ready for R&D, QA and manufacturing test environments (remote control, depending on configuration)
Common applications: 400G/200G/100G Ethernet, PAM4 optical/electrical compliance testing AI server / HPC related applications: PCIe / CXL high-speed I/O, retimer/redriver validation and link margin testing Designed for transceiver / optical module characterization and validation for modern data center networks