產品介紹
此產品為 【弘燁科技】Agilent E4991A 3GHz RF Impedance / Material Analyzer 阻抗與材料分析儀。
品牌為 是德/安捷倫(Keysight/Agilent/HP)，型號為 E4991A。
目前頁面已整理基本產品資訊，並提供可下載之型錄或規格文件，建議可先參考下方檔案下載區。
規格
主要規格與效能（Core Specifications）
產品定位（Product Overview）
・由 Agilent Technologies 設計之高階 RF Impedance / Material Analyzer
・採用 RF-IV Measurement Technique（非反射式量測架構）
・Internal Synthesizer Sweep：1 MHz to 3 GHz ・Frequency Resolution：1 mHz
・支援超寬頻高解析阻抗掃描分析
量測精度（Measurement Accuracy）
・Basic Impedance Accuracy：±0.8%
量測技術架構（Measurement Technology）
・RF-IV Technique（電壓電流量測法）
・較反射式量測具更寬阻抗範圍與更高準確度
材料量測能力（Material Measurement Capability）
・Dielectric & Magnetic Material Measurement Solutions ・Frequency Range：1 MHz to 1 GHz
晶圓與微元件量測（On-Wafer Measurement – Option 010）
・支援 RF Probe System（如 Cascade Microtech）
・進行 On-Wafer 與微結構元件阻抗量測
溫度特性量測（Temperature Characteristic Test – Option 007） ・Temperature Range：-55°C to +150°C
・高精度溫漂補償分析功能
內建分析功能（Built-in Analysis Functions）
系統整合與特性（System Integration & Features）
・支援多種治具與材料測試套件整合
・可進行高頻、偏壓、溫度同步量測分析
典型應用（Typical Applications）
・5G / 6G 射頻模組與高頻被動元件特性量測
E4991A - 002 - ADD MATERIAL MEASUREMENT FIRMWARE E4991A - 007 - TEMPERATURE CHARACTERISTIC TEST KIT E4991A - 010 - PROBE STATION CONNECTION KIT
E4991A - 16190B - PERFORMANCE TEST KIT
E4991A - 16192A - PARALLEL ELECTRODE SMD TEST FIXTURE E4991A - 16194A - HIGH TEMPERATURE COMPONENT TEST FIXTURE E4991A - 16196A - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ
E4991A - 16196B - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ E4991A - 16196C - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ E4991A - 16196D - PARALLEL ELECTRODE SMD TEST FIXTURE, DC TO 3 GHZ
E4991A - 16197A - BOTTOM ELECTRODE SMD TEST FIXTURE
E4991A - 16453A - DIELECTRIC MATERIAL TEST FIXTURE E4991A - 16454A - MAGNETIC MATERIAL TEST FIXTURE E4991A - 1A7 - ISO 17025 COMPLIANT CALIBRATION
E4991A - 1D5 - HIGH STABILITY FREQUENCY REFERENCE E4991A - 800 - STANDARD FREQUENCY REFERENCE
原廠英文說明
The E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R+D of components and circuit designers who evaluate components in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range.
Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.
The E4991A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz). The E4991A-010, Probe Station Connection Kit, enables us to easily connect the Agilent E4991A to a RF probe system from Cascade Microtech for making on-wafer impedance measurements. The temperature characteristic test kit, the E4991A-007, is a new solution of temperature characteristic measurement for components and materials.
This option provides highly accurate temperature characteristic analysis capability within the wide temperature range from - 55C to + 150C with a powerful temperature drift compensation function.