是德/安捷倫(Keysight/Agilent/HP)

Agilent 54754A 差動 TDR 量測模組|Differential TDR Module

產品定位與應用Keysight / Agilent / HP PD1528947923366 Agilent 54754A 差動 TDR 量測模…

品牌:是德/安捷倫(Keysight/Agilent/HP) 型號:54754A 料號:PD1528947923366
【弘燁科技】Agilent 54754A 差動 TDR 量測模組|Differential TDR Module
品牌
是德/安捷倫(Keysight/Agilent/HP)
型號
54754A
類別
規格資料
已整理
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產品介紹

產品定位與應用Keysight / Agilent / HP PD1528947923366 Agilent 54754A 差動 TDR 量測模組

Differential TDR Module 屬於向量網路分析與射頻微波元件量測設備,適合用於S 參數、回波損耗、增益/損耗、VSWR、相位、群延遲、濾波器、放大器、天線、線纜與 RF 模組驗證等情境。

實際量測範圍與選配需依機身配置、附件與校正狀態確認。

選型時建議同步確認頻率範圍、埠數、動態範圍、校正件、測試治具、Bias Tee、衰減器與其他選配功能,避免後續因選配、治具或校正條件不符而影響測試進度。

弘燁科技可依目前庫存、附件組合、校正需求與交期,協助比對同級替代型號並整理詢價所需資訊。

規格

Agilent 54754A Differential TDR Module 為高速 Differential TDR / TDT 量測模組(差動時域反射量測模組),可搭配 Agilent / Keysight 取樣示波與 DCA 平台使用,提供高頻差動通道之 阻抗、反射、不連續點與傳輸特性分析,適用於高速差動介面設計驗證、訊號完整性(SI)分析,以及 AI 伺服器/資料中心高速互連 之通道除錯與驗證場景。

模組化架構(Modular TDR Measurement Platform)

Differential TDR / TDT Plug-in 量測模組

Differential TDR / TDT plug-in measurement module

需搭配相容之取樣示波器或 DCA 主機平台使用

Requires compatible sampling oscilloscope or DCA mainframe

可整合於高速訊號完整性量測平台

Suitable for SI validation, R&D and advanced debug applications

TDR / TDT 量測(TDR / TDT Measurements)

內建雙通道差動 TDR / TDT 量測能力

Differential TDR / TDT measurements for high-speed channels 支援 1-port、2-port Common Mode 與 Differential Mode 量測 Supports 1-port, 2-port common-mode and differential measurements

適用於高速差動通道之阻抗分析與反射點定位

Ideal for impedance characterization and discontinuity location

訊號完整性分析(Signal Integrity Analysis)
差動阻抗、不連續點與反射特性分析

Differential impedance, reflection and discontinuity analysis

適用於高速 PCB、背板、連接器與線纜驗證

Suitable for PCB traces, backplanes, connectors and cables

可用於高速 SerDes 與 I/O 通道設計除錯

Ideal for high-speed SerDes and I/O channel debugging

校正與進階功能(Calibration & Advanced Features)

內建 TDR / TDT 自動校正功能

Built-in TDR / TDT calibration
使用者可選 Edge Speed(上升時間設定)
User-selectable edge speed

支援 S-Parameter 量測(需主機 FW 與選配)

S-parameter measurement support (option / firmware dependent)

AI 相關應用(AI / Data Center Applications)

AI 伺服器 / GPU Cluster 高速差動通道驗證
資料中心背板、線纜與連接器阻抗與反射分析
高速主機板 Bring-up 與通道品質除錯
適用於高速差動互連設計與 SI 驗證流程
相容主機平台(Compatibility)

54750A High-Bandwidth Digitizing Oscilloscope Mainframe 83480A Digital Communications Analyzer Mainframe

86100A / 86100B Infiniium DCA Mainframe
86100C Infiniium DCA-J Mainframe
86100D Infiniium DCA-X Mainframe
原廠英文說明

The Agilent 54754A oscilloscope is a graph-displaying device – it draws a graph of an electrical signal. In most applications, the graph shows how signals change over time: the vertical (Y) axis represents voltage and the horizontal (X) axis represents time. The intensity or brightness of the display is sometimes called the Z axis.The Agilent 54754A oscilloscope's simple graph can tell you many things about a signal, such as: the time and voltage values of a signal, the frequency of an oscillating signal, the “moving parts” of a circuit represented by the signal, the frequency with which a particular portion of the signal is occurring relative to, other portions, whether or not a malfunctioning component is distorting the signal, how much of a signal is direct current (DC) or alternating current (AC) and how much of the signal is noise and whether the noise is changing with time.