・8712ES / 8714ES：
　內建 S-Parameter Test Set，支援完整雙埠向量誤差修正
　可同時量測 S21（Transmission）與 S11（Reflection）
　支援 Delay、SWR 等多種顯示格式（Rectangular / Polar / Smith Chart）

・8712ET / 8714ET：
　內建 Transmission / Reflection Test Set
　支援幅度與相位量測，可顯示 Transmission 與 Reflection Response
　支援 Complex Impedance、SWR、Delay 等格式（Rectangular / Polar / Smith Chart）
　採用進階向量誤差修正技術，提升量測準確度

・8712ES / 8712ET：300 kHz ～ 1.3 GHz
・8714ES / 8714ET：300 kHz ～ 3.0 GHz

・Internal Synthesized Source
・Frequency Resolution：1 Hz
・雙獨立量測通道，可同時顯示兩組量測參數

・RF / Microwave 被動元件量測
・通訊模組與射頻前端測試
・高速線纜與端口反射特性分析
・AI 伺服器 / HPC 高速互連（Port Reflection / Return Loss）
・Signal Integrity（SI）基本反射與阻抗量測
・研發實驗室 / QA / 教學與產線測試

Agilent / HP 8712ES / 8712ET / 8714ES / 8714ET datasheet: 

The 8712/14ES features an S-parameter test set with full two-port vector-error correction, providing complete and accurate measurements of device S-parameters. Two independent channels can measure and display two parameters such as S21 (transmission) and S11 (reflection) in a variety of formats including delay and SWR, on retangular, polar or Smith-chart displays.The 8712/14ET features a built-in transmission/reflection test set with a full range of magnitude and phase measurements. Two independent channels can measure and display two device parameters, such as transmission and reflection response, in a variety of formats including complex impedance, SWR, and delay, on rectangular, polar or Smith-chart displays. These analyzers also employ advanced vector-error-correction techniques to enhance measurement accuracy.

• Datasheet PD1527823366157