其他

Advantest Q8384 光學頻譜分析儀|Optical Spectrum Analyzer (OSA)|光通訊量測 OSA

【弘燁科技・專業光通訊/量測儀器服務】 Advantest Q8384 Optical Spectrum Analyzer(光學頻譜分析儀 / …

品牌:其他 型號:Q8384 / OF10 / 600 / 1700
Advantest Q8384 光學頻譜分析儀|Optical Spectrum Analyzer (OSA)|光通訊量測 OSA
Brand
其他
Model
Q8384 / OF10 / 600 / 1700
Category
Specifications
Available
Downloads
Available

產品介紹

【弘燁科技・專業光通訊/量測儀器服務】
Advantest Q8384 Optical Spectrum Analyzer(光學頻譜分析儀 / OSA)
支援型號:Q8384

我們提供完整服務:
全新/二手儀器買賣|租賃|出售|回收收購|維修保養|校驗校正

Advantest Q8384 為廣泛應用於光通訊與光電測試的 Optical Spectrum Analyzer(OSA 光學頻譜分析儀),可用於雷射光源光譜特性量測、中心波長/旁瓣分析、WDM/DWDM 通道波長與功率驗證,以及 EDFA/光放大器 ASE 噪聲評估與濾波器頻譜響應測試。Q8384 具備穩定量測與良好解析度表現,可協助工程師快速掌握光譜分佈、峰值波長、功率與信號品質,適用研發實驗室、QA 驗證及產線抽測等光學量測需求。

常見於光通訊研發、QA 及產線測試,適用於:
✓ 雷射波長/光譜量測(Laser Wavelength / Spectrum / Stability)
✓ WDM/DWDM 通道分析(Channel Power / Wavelength / OSNR)
✓ EDFA / 光放大器增益與 ASE 噪聲量測
✓ 光學濾波器、耦合器、FBG 等元件特性量測
✓ 光收發器模組測試(SFP/QSFP/Transceiver)
✓ 光功率分佈與光譜分析(Optical Spectrum / Power Distribution)

我們提供:
・儀器功能檢測與校驗
・現貨/客訂均可(依需求與配件供貨)
・多品牌 OSA 比較諮詢(YOKOGAWA / Anritsu / Keysight / Advantest 等)
・高價回收收購儀器
・FAE 工程師協助應用與配件建議(光纖跳線、轉接頭、量測設定)

歡迎來電諮詢,提供現貨查詢、快速報價、租賃方案與交期安排,協助您快速導入光通訊測試需求。

規格

Advantest Q8384 Optical Spectrum Analyzer(OSA)規格

  • Wavelength range:600 ~ 1700 nm

  • Resolution bandwidth(RBW):10 pm(state-of-the-art)

  • Wavelength accuracy:±20 pm(Option 25)

  • Sensitivity:-87 dBm

  • Polarization dependence:±0.05 dB

  • RBW accuracy:±2%

  • Measurement functions:Power & Spectral Width、多種功率/光譜寬度量測

  • DWDM analysis:支援多種 WDM/DWDM 通道分析功能

  • Optical amplifier measurements:EDFA/光放大器參數量測

  • Pulse light measurement:脈衝光量測

  • Gated measurement:支援 gated 量測(loop testing 適用)

English

儀器介紹

Q8384 is a high-grade optical spectrum analyzer (Advantest) with a 4-pass monochromator and extremely low polarization dependance. Thanks to a special method used, a value of ±0.05 dB can be guaranteed, the typical value is as low as 0.02 dB. The narrowest resolution bandwidth and the broad dynamic range make the Q8384 an ideal measuring instrument in the DWDM technology for closest channel spacing. A special measurement function allows the automatic determination of erbium-doped fiber amplifiers (EDFA) parameters; these are e.g. noise figure, gain and spontaneous emission by simple comparison of the signal at the amplifier input with the signal at the amplifier output.

All these features are of course also of great advantage for the measurement of laser diodes, LEDs and other light sources, evaluating their parameters by single push button operation. A curve fitting function directly shows the electroluminescence characteristic by fitting a Gaussian distribution into the emission spectrum. This is a valuable aid in the measurement of erbium- doped fiber amplifiers EDFA's and LDs. Special functions for pulsed light allow measurements of fiber loop transmission systems. Internal or external triggering is possible.

The measurement time is 0.5 second for a span of 10 nm in fast sweep mode and varies as a function of the span and the required dynamic range. The highest sensitivity is attained for wideband sources with a resolution of 5 nm, while narrowband sources (laser) can reliably be analyzed down to the noise level with narrow resolution bandwidths. A normalization function in conjunction with a white light source enables direct measurement of the transmission and loss characteristics of optical filters and fibers and other components.

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