產品介紹
The Agilent 54754A oscilloscope is a graph-displaying device – it draws a graph of an electrical signal. In most applications, the graph shows how signals change over time: the vertical (Y) axis represents voltage and the horizontal (X) axis represents time. The intensity or brightness of the display is sometimes called the Z axis.
The Agilent 54754A oscilloscope's simple graph can tell you many things about a signal, such as: the time and voltage values of a signal, the frequency of an oscillating signal, the “moving parts” of a circuit represented by the signal, the frequency with which a particular portion of the signal is occurring relative to, other portions, whether or not a malfunctioning component is distorting the signal, how much of a signal is direct current (DC) or alternating current (AC) and how much of the signal is noise and whether the noise is changing with time.
Agilent 54754A Differential TDR Module 為高速 Differential TDR / TDT 量測模組（差動時域反射量測模組），可搭配 Agilent / Keysight 取樣示波與 DCA 平台使用，提供高頻差動通道之 阻抗、反射、不連續點與傳輸特性分析，適用於高速差動介面設計驗證、訊號完整性（SI）分析，以及 AI 伺服器／資料中心高速互連 之通道除錯與驗證場景。
Differential TDR / TDT Plug-in 量測模組
Differential TDR / TDT plug-in measurement module
需搭配相容之取樣示波器或 DCA 主機平台使用
Requires compatible sampling oscilloscope or DCA mainframe
可整合於高速訊號完整性量測平台
Suitable for SI validation, R&D and advanced debug applications
內建雙通道差動 TDR / TDT 量測能力
Differential TDR / TDT measurements for high-speed channels
適用於高速差動通道之阻抗分析與反射點定位
Ideal for impedance characterization and discontinuity location
差動阻抗、不連續點與反射特性分析
Differential impedance, reflection and discontinuity analysis
適用於高速 PCB、背板、連接器與線纜驗證
Suitable for PCB traces, backplanes, connectors and cables
可用於高速 SerDes 與 I/O 通道設計除錯
Ideal for high-speed SerDes and I/O channel debugging
內建 TDR / TDT 自動校正功能
Built-in TDR / TDT calibration
使用者可選 Edge Speed（上升時間設定）
User-selectable edge speed
支援 S-Parameter 量測（需主機 FW 與選配）
S-parameter measurement support (option / firmware dependent)
AI 伺服器 / GPU Cluster 高速差動通道驗證
資料中心背板、線纜與連接器阻抗與反射分析
高速主機板 Bring-up 與通道品質除錯
適用於高速差動互連設計與 SI 驗證流程
54750A High-Bandwidth Digitizing Oscilloscope Mainframe
83480A Digital Communications Analyzer Mainframe
86100A / 86100B Infiniium DCA Mainframe
86100C Infiniium DCA-J Mainframe
86100D Infiniium DCA-X Mainframe
規格
Agilent 54754A Differential TDR Module 為高速 Differential TDR / TDT 量測模組（差動時域反射量測模組），可搭配 Agilent / Keysight 取樣示波與 DCA 平台使用，提供高頻差動通道之 阻抗、反射、不連續點與傳輸特性分析，適用於高速差動介面設計驗證、訊號完整性（SI）分析，以及 AI 伺服器／資料中心高速互連 之通道除錯與驗證場景。
模組化架構（Modular TDR Measurement Platform）
-
Differential TDR / TDT Plug-in 量測模組
Differential TDR / TDT plug-in measurement module -
需搭配相容之取樣示波器或 DCA 主機平台使用
Requires compatible sampling oscilloscope or DCA mainframe -
可整合於高速訊號完整性量測平台
Suitable for SI validation, R&D and advanced debug applications
TDR / TDT 量測（TDR / TDT Measurements）
-
內建雙通道差動 TDR / TDT 量測能力
Differential TDR / TDT measurements for high-speed channels -
支援 1-port、2-port Common Mode 與 Differential Mode 量測
Supports 1-port, 2-port common-mode and differential measurements -
適用於高速差動通道之阻抗分析與反射點定位
Ideal for impedance characterization and discontinuity location
訊號完整性分析（Signal Integrity Analysis）
-
差動阻抗、不連續點與反射特性分析
Differential impedance, reflection and discontinuity analysis -
適用於高速 PCB、背板、連接器與線纜驗證
Suitable for PCB traces, backplanes, connectors and cables -
可用於高速 SerDes 與 I/O 通道設計除錯
Ideal for high-speed SerDes and I/O channel debugging
校正與進階功能（Calibration & Advanced Features）
-
內建 TDR / TDT 自動校正功能
Built-in TDR / TDT calibration -
使用者可選 Edge Speed（上升時間設定）
User-selectable edge speed -
支援 S-Parameter 量測（需主機 FW 與選配）
S-parameter measurement support (option / firmware dependent)
AI 相關應用（AI / Data Center Applications）
-
AI 伺服器 / GPU Cluster 高速差動通道驗證
-
資料中心背板、線纜與連接器阻抗與反射分析
-
高速主機板 Bring-up 與通道品質除錯
-
適用於高速差動互連設計與 SI 驗證流程
相容主機平台（Compatibility）
-
54750A High-Bandwidth Digitizing Oscilloscope Mainframe
-
83480A Digital Communications Analyzer Mainframe
-
86100A / 86100B Infiniium DCA Mainframe
-
86100C Infiniium DCA-J Mainframe
-
86100D Infiniium DCA-X Mainframe
儀器介紹
The Agilent 54754A oscilloscope is a graph-displaying device – it draws a graph of an electrical signal. In most applications, the graph shows how signals change over time: the vertical (Y) axis represents voltage and the horizontal (X) axis represents time. The intensity or brightness of the display is sometimes called the Z axis.
The Agilent 54754A oscilloscope's simple graph can tell you many things about a signal, such as: the time and voltage values of a signal, the frequency of an oscillating signal, the “moving parts” of a circuit represented by the signal, the frequency with which a particular portion of the signal is occurring relative to, other portions, whether or not a malfunctioning component is distorting the signal, how much of a signal is direct current (DC) or alternating current (AC) and how much of the signal is noise and whether the noise is changing with time.