產品介紹
Anritsu MS9740B Optical Spectrum Analyzer(光學頻譜分析儀 / OSA)
支援型號:MS9740B(其他 OSA 型號亦可洽詢)
產品定位與應用價值
Anritsu MS9740B 為安立(Anritsu)經典高性能 Optical Spectrum Analyzer(OSA 光學頻譜分析儀),可用於量測光源光譜、雷射波長、功率分佈與光訊號特性,適用光通訊與光電研發 / 產線測試。MS9740B 常見於 WDM / DWDM 系統驗證、光收發器模組測試、雷射 / EDFA 評估、濾波器 / 光學元件量測等情境,可協助工程師快速進行光譜分析與波長穩定度驗證,是光通訊實驗室與製造測試不可或缺的量測設備之一。
常見於光通訊研發、QA 與產線測試,適用於:雷射光源量測(Laser wavelength / linewidth / stability) WDM / DWDM 光通訊訊號分析(Wavelength / Channel power) OSNR、光譜分析與光功率量測(Optical spectrum / power distribution) 光收發器模組測試(SFP / QSFP 等) EDFA / 光放大器評估與增益特性量測 光學濾波器 / 光柵 / 耦合器等元件特性量測
我們提供
- 儀器功能檢測與校驗
- 現貨/客訂均可(依需求與配件供貨)
- 高價回收收購儀器
- FAE 工程師協助應用與配件建議(光纖跳線、轉接頭、校正 / 量測設定)
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規格
原廠完整規格表 / Full Specifications
以下整理原廠完整規格表,供型號確認、規格比對與詢價確認使用。
| Specifications | Details | |
|---|---|---|
| MS9740B | MS9740B-009 | |
| Applicable optical fiber | SM fiber (ITU-T G.652), 50μm/125μm GI fiber | SM fiber (ITU-T G.652), 50μm/125μm GI fiber, 62.5μm/125μm GI fiber |
| Optical connector | User replaceable: FC, SC, ST, DIN | |
| Wavelength measurement range | 600 nm to 1750 nm | |
| Wavelength accuracy*1 | ±20 pm (1520 nm to 1620 nm, Resolution: 0.03 nm to 0.2 nm)*2 ±100 pm (1520 nm to 1620 nm, Resolution: 0.5 nm, 1.0 nm)*2 ±300 pm (600 nm to 1520 nm)*3 ±200 pm (1520 nm to 1570 nm)*3 ±300 pm (1570 nm to 1750 nm)*3 |
±50 pm (1530 nm to 1570 nm, Resolution: 0.07 nm to 0.2 nm)*2 ±100 pm (1530 nm to 1570 nm, Resolution: 0.5 nm, 1.0 nm)*2 ±300 pm (1570 nm to 1750 nm)*4 |
| Setting resolution | 0.03, 0.05, 0.07, 0.1, 0.2, 0.5, 1.0 nm (RBW 3 dB transparent bandwidth) | 0.07, 0.1, 0.2, 0.5, 1.0 nm (RBW 3 dB transparent bandwidth) |
| Maximum input power | +23 dBm (Optical ATT: On) | |
| Dynamic range*1 | High dynamic range: 70 dB (±1 nm from peak wavelength), 60 dB (±0.4 nm from peak wavelength), 42 dB (±0.2 nm from peak wavelength) Normal dynamic range: 62 dB (±1 nm from peak wavelength), 58 dB (±0.4 nm from peak wavelength), 42 dB (±0.2 nm from peak wavelength) [Wavelength: 1550 nm, Resolution: 0.05 nm, Optical Att: Off, 20° to 30°C] |
High dynamic range: 70 dB (±1 nm from peak wavelength, 20° to 30°C), 60 dB (±0.5 nm from peak wavelength, 20° to 30°C) 65 dB (±1 nm from peak wavelength, 5° to 45°C), 55 dB (±0.5 nm from peak wavelength, 5° to 45°C) Normal dynamic range: 62 dB (±1 nm from peak wavelength, 20° to 30°C), 58 dB (±0.5 nm from peak wavelength, 20° to 30°C) 57 dB (±1 nm from peak wavelength, 5° to 45°C), 53 dB (±0.5 nm from peak wavelength, 5° to 45°C) [Wavelength: 1550 nm, Resolution: 0.07 nm, using SM fiber, Optical Att: Off] |
| Sweep*1 | Sweep time: ≤0.2 s (span: 5 nm, Resolution: 0.1 nm), ≤0.3 s (span: 500 nm) [VBW: 10 kHz, Normal dynamic range, center 1550 nm (span: 5 nm), 1200 nm (span: 500 nm), sweep start to stop, no optical input, sampling point: ≤501] Sweep time: 0.35 s / 30 nm (typ.) [VBW: 1 kHz- Fast, dynamic range, center 1550 nm, Resolution: 0.1 nm, sweep start to stop, optical input -10 dBm, sampling point: 1001] Sweep time: 1,65 s / 30 nm (typ.) [VBW: 200 Hz-Fast, dynamic range, center 1550 nm, Resolution: 0.1 nm, sweep start to stop, optical input -10 dBm, sampling point: 1001] |
|
| SMSR Reproducibility (with MS9740B-020) | ±1.4 dB (MS9740B), ±1.8 dB (with MS9740B-009 installed) Using SM fiber and DFB-LD with 1550 nm wavelength at 10 dBm peak power input, with 45 dB max SMSR and no change in polarization conditions Pulse conditions: 5 kHz min repetition frequency and 1% min Duty Pulse Mode enabled, 1 kHz VBW, 0.1 nm Setting Resolution, 10 nm max span, 501 sampling points, at 23°C ±5°C |
|
| Dimensions and Mass | 426 (W) × 177 (H) × 350 (D) mm (excluding projections) ≤15.0 kg (without option) | |
儀器介紹
The benchtop Optical Spectrum Analyzer MS9740B features wide dynamic range, high resolution, and fast sweep speeds over a wavelength range of 600 nm to 1750 nm. It supports multimode fiber input and is ideal for manufacturing and evaluating 850-nm band VCSEL modules.
As well as keeping the same functions and performance as its predecessor, the MS9740B slashes measurement processing times by up to half*1 while overcoming problems of decreased measurement sensitivity caused by increased processing speed.
Moreover, it retains optical active device (LD-Module, DF-LD, FP-LD, LED, PMD, WDM, Opt Amp, and WDM Filter) measurement menu screens for evaluating devices. It supports all-at-once measurements of key evaluation items, such as optical center wavelength, level, OSNR, spectrum width, etc., and displays these results at one screen.