二手儀器-中古儀器-儀器維修-儀器租賃-儀器買賣-收購服務-弘燁科技

The Keysight 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4156C provide a firm foundation for future expansion with other measurement instruments. This unit comes with four source/monitor units, two voltage monitor units, and two voltage source units.

產品介紹

儀器介紹
儀器規格
檔案下載

Highly accurate parameter analyzer for advanced device characterization
4x High-resolution SMU, 2xVSU and 2xVMU
Fill-in-the blanks front panel operation
1 femtoamp and 0.2 microvolt measurement resolution
QSCV, Stress Mode, Knob-sweep, Stand-by function

The Keysight 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory bench top solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4156C.

Four built-in high-resolution source /monitor units, two voltage source units, and two voltage monitor units
Measurement resolutiuon: 1fA and 0.2µV
Full Kelvin: force, sense, and guard terminals for each HRSMU
Performs quasi-static capacitance measurements versus voltage measurements
Automatically extracts process parameters without manually manipulating screen markers
Measures leakage characteristics with ultra-low leakage SMUs
Automates device characterization with integrated pulse generators and selector switches
On-wafer reliability tests with built-in stressing modes
Point-and-click measurements with graphical user interface
Provides graphical data analysis capabilities with a Windows environment
QSCV, Stress Mode, Knob-sweep, Stand-by function
Triggering modes allow synchronized AC/DC measurements
IBASIC user functions allow data to be plotted and analyzed

Agilent 4156C