The Hioki 3535 LCR HiTESTER measures across the broad frequency range of 100kHz to 120MHz. The 6ms high-speed measurement capability is particularly useful with the built in comparator, load functions and BIN (classification) measurements. Achieve measurement flexibility by detaching the head amp unit fromt he main unit and placking it in proximity to the test object so as to minimize the effect of test leads on measurements.
【弘燁科技-專業儀器】Hioki 3535 LCR HiTester 二手儀器/買賣/租賃/出租/購買/價格/收購/回收/維修儀器/校驗/校正儀器
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The Hioki 3535 LCR HiTESTER measures across the broad frequency range of 100kHz to 120MHz. The 6ms high-speed measurement capability is particularly useful with the built in comparator, load functions and BIN (classification) measurements. Achieve measurement flexibility by detaching the head amp unit fromt he main unit and placking it in proximity to the test object so as to minimize the effect of test leads on measurements.
【弘燁科技-專業儀器設備】- Hioki 3535 LCR HiTester 二手儀器/買賣/租賃/出租/購買/價格/維修儀器/校驗儀器
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Specifications
Measurement Items
|Z|, |Y|, Q, Rp, Rs(ESR), G, X, B, Θ, Ls, Lp, Cs, Cp, D(tan δ)
Measurement Ranges
| 1kΩ range | 10kΩ range | 100kΩ range | |
| Z, R | 100mΩ to 2kΩ | 1kΩ to 20kΩ | 10kΩ to300kΩ |
| C | 0.66pF to 15.9µF | 0.066pF to 1.59nF | 4.4fF to 159pF |
| L | 0.133nH to 3.18mH | 1.33µH to 31.8mH | 13.3µH to 477mH |
| Θ |
-180.00° to 180.00°
|
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Measurement Frequency
100 kHz to 120 MHz ( 100Hz to 100kHz steps )
Basic Accuracy
|Z|: ±0.5 % rdg.
Phase angle: ±0.3°
Output Impedance
50 ±10Ω (at 100 kHz)
Measurement Signal Level
5 mV to 1 V: 20 mA max. ( up to 10.00 MHz )
5 mV to 500 mV: 10 mA max. ( above 10.01 MHz )
Setting Resolution: 1mV steps
200 µA to 20 mA: 1 V max. ( up to 10.00 MHz )
200 µA to 10 mA: 0.5 V max. (above 10.01 MHz)
Setting Resolution: 10 µA steps
Measurement Time
6 ± 1 ms (nominal)
Interfaces
GP-IB, RS-232C and EXT I/O ( standard )
Power
100 to 240 VAC, 50/60 Hz, 50 VA
儀器規格:3535_ds
